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lines changed Original file line number Diff line number Diff line change 142142\newacronym {SEE}{SEE}{Single Event Effects}
143143\newacronym {MOSFET}{MOSFET}{Metal-Oxide-Semiconductor Field-Effect Transistor}
144144\newacronym {TID}{TID}{Total Ionizing Dose}
145- \newacronym {TNID}{TNID}{Total Ionizing Dose}
145+ \newacronym {TNID}{TNID}{Total Non- Ionizing Dose}
146146\newacronym {EDAC}{EDAC}{Error Detection and Correction}
147- \newacronym {EMI}{EMI}{Electromagnetic Compatibility}
147+ \newacronym {EMI}{EMI}{Electromagnetic Interference}
148+ \newacronym {EMC}{EMC}{Electromagnetic Compatibility}
148149
149150
150151% High Contrast Imaging:
246247\newacronym {UVS}{UVS}{Ultraviolet Spectrograph}
247248\newacronym {STIS}{STIS}{Space Telescope Imaging Spectrograph}
248249\newacronym {SCoOB}{scoob}{space-coronagraph optical bench}
249- \newacronym {HWO}{HWO}{Habitable World Observatory}
250+ \newacronym {HWO}{HWO}{Habitable Worlds Observatory}
250251
251252% Software:
252253\newacronym {AURIC}{AURIC}{The Atmospheric Ultraviolet Radiance Integrated Code}
358359\newacronym {LNA}{LNA}{Low Noise Amplifier}
359360\newacronym {FoS}{FoS}{Factors of Safety}
360361\newacronym {DLL}{DLL}{Design Limit Loads}
361- \newacronym {MoS}{MoS}{Margin of Safety = (Material Allowable / (Max Stree \gls {MPE} * \gls {FoS})) - 1}
362+ \newacronym {MoS}{MoS}{Margin of Safety = (Material Allowable / (Max Stress \gls {MPE} * \gls {FoS})) - 1}
362363\newacronym {MPE}{MPE}{Maximum Predicted Environments}
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